Introduction
In the design of safety-related control parts (SRP/CS) of machinery control systems, the ISO 13849-1 standard provides a systematic approach to determine Performance Level (PL). The determination of PL is not arbitrary; it is based on quantitative calculations of three key parameters:
- MTTFd (Mean Time To Dangerous Failure): Mean Time To Dangerous Failure, measuring component reliability
- DC (Diagnostic Coverage): Diagnostic Coverage, measuring fault detection capability
- CCF (Common Cause Failure): Common Cause Failure prevention, measuring redundancy channel independence
These three parameters work together with the system architecture Category to determine the PL level that the system can achieve through the bar chart provided by the standard or precise calculation methods. This article will provide an in-depth explanation of the definitions, calculation methods, and practical applications of these three key parameters.
Parameter Relationship Overview
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┌─────────────────────────────────────────────────────────────────────┐
│ PL Calculation Parameter Relationship │
├─────────────────────────────────────────────────────────────────────┤
│ │
│ ┌─────────────┐ │
│ │ Category │ │
│ │ (Architecture)│ │
│ └──────┬──────┘ │
│ │ │
│ ┌─────────────────────┼─────────────────────┐ │
│ │ │ │ │
│ ▼ ▼ ▼ │
│ ┌─────────────┐ ┌─────────────┐ ┌─────────────┐ │
│ │ MTTFd │ │ DCavg │ │ CCF │ │
│ │ │ │ │ │ │ │
│ │Component │ │ Fault │ │ Independence│ │
│ │Reliability │ │Detection │ │ │ │
│ │ │ │ │ │ │ │
│ │Unit: years │ │Unit: % │ │Unit: points │ │
│ └──────┬──────┘ └──────┬──────┘ └──────┬──────┘ │
│ │ │ │ │
│ └────────────────────┴────────────────────┘ │
│ │ │
│ ▼ │
│ ┌─────────────┐ │
│ │ PL │ │
│ │(via bar chart)│ │
│ └─────────────┘ │
│ │
└─────────────────────────────────────────────────────────────────────┘
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1. MTTFd: Mean Time To Dangerous Failure
1.1 Definition and Basic Concepts
MTTFd (Mean Time To Dangerous Failure) is one of the core parameters in the ISO 13849-1 standard, defined as the expected mean time to dangerous failure.
From a technical perspective, MTTFd represents the average working time of a component or system before a dangerous failure occurs. This parameter directly reflects the hardware reliability level: the higher the MTTFd value, the more reliable the component, and the lower the probability of dangerous failure.
There is a mathematical relationship between MTTFd and failure rate:
MTTFd = 1 / λD
Where:
- λD = Dangerous failure rate (failures/hour)
- MTTFd unit: years (1 year ≈ 8760 hours)
When understanding MTTFd, note the following points:
-
Dangerous Failure vs. Safe Failure: MTTFd only considers dangerous failures, which are faults that can lead to safety function failure. Safe failures (such as fail-safe actions) are not included in the calculation.
-
Statistical Mean Value: MTTFd is a statistical expected value, not the actual lifetime of an individual component. The actual failure time may be greater or less than MTTFd.
-
Time Unit: In the standard, MTTFd is expressed in years for engineering convenience.
1.2 MTTFd Classification
ISO 13849-1 divides MTTFd into three levels for use in bar charts:
| MTTFd Range | Level Code | Description | Typical Application |
|---|---|---|---|
| 3 years ≤ MTTFd < 10 years | Low | Basic reliability | Low-risk scenarios |
| 10 years ≤ MTTFd < 30 years | Medium | Medium reliability | Typical applications |
| 30 years ≤ MTTFd ≤ 100 years* | High | High reliability | High-risk scenarios |
*Note: For Category 4 architecture, the upper limit of MTTFd is 2500 years
Important Notes:
- MTTFd should not be less than 3 years, otherwise it does not meet basic safety requirements
- The upper limit of MTTFd is to avoid over-reliance on the high reliability of a single component
- Category 4 allows higher MTTFd (2500 years) because its architecture has better fault tolerance
1.3 MTTFd Data Sources
In practical engineering, obtaining accurate MTTFd data is the first step in calculation. In order of priority, MTTFd data sources include:
| Priority | Data Source | Reliability | Description |
|---|---|---|---|
| 1 | Component manufacturer data | Highest | Datasheets, FMEDA reports |
| 2 | Industry databases | High | SN 29500, IEC 62380, FMD |
| 3 | Standard Annex C values | Medium | ISO 13849-1 Annex C |
| 4 | Analogous estimation | Low | Extrapolation based on similar components |
Best Practices:
- Prioritize FMEDA (Failure Modes, Effects, and Diagnostic Analysis) reports provided by manufacturers
- For safety-critical components, require suppliers to provide reliability data
- When using industry databases, pay attention to matching application conditions
- Analogous estimation is only applicable to preliminary assessment; final design should use measured data
1.4 Typical Component MTTFd Reference Values
Based on ISO 13849-1 Annex C and industry experience, the following are reference MTTFd values for typical components:
Electromechanical Components
| Component Type | Typical MTTFd | Application Conditions | Notes |
|---|---|---|---|
| Signal relay | 100 years | Derated use | Low current load |
| Power relay | 20 years | Rated load | Rated current |
| Contactor | 20-50 years | Normal use | Depends on operating frequency |
| Emergency stop button | 50 years | Low operating frequency | Mechanical life |
| Position switch | 30 years | Normal use | Industrial environment |
| Connector | 1000 years | Single-point connection | Stable connection |
Electronic Components
| Component Type | Typical MTTFd | Application Conditions | Notes |
|---|---|---|---|
| Thin film resistor | 1000 years | 50% derating | Low power application |
| Ceramic capacitor | 100 years | Derated use | Voltage derating |
| Electrolytic capacitor | 20 years | High temperature derating | Temperature sensitive |
| Diode | 1000 years | Forward application | Standard rectification |
| Transistor | 500 years | Derated use | Power derating |
| Digital IC | 100-500 years | Normal application | Depends on complexity |
| MCU | 50-200 years | Safety application | Derated use |
Hydraulic/Pneumatic Components
| Component Type | Typical MTTFd | Application Conditions | Notes |
|---|---|---|---|
| Pneumatic solenoid valve | 30 years | Clean air supply | Regular maintenance |
| Hydraulic solenoid valve | 20 years | Clean oil | Oil management |
| Pneumatic cylinder | 50 years | Normal use | Seal maintenance |
| Hydraulic cylinder | 30 years | Normal use | Seal maintenance |
1.5 MTTFd Calculation Methods
Single-Channel System Calculation
For series systems (where any component failure causes system failure), the MTTFd calculation formula is:
1/MTTFd_channel = Σ(1/MTTFd_i)
That is:
MTTFd_channel = 1 / (1/MTTFd_1 + 1/MTTFd_2 + ... + 1/MTTFd_n)
Calculation Example:
A simple emergency stop safety circuit contains the following components:
- Emergency stop button: MTTFd = 50 years
- Safety relay: MTTFd = 100 years
- Contactor: MTTFd = 30 years
Calculation steps:
1/MTTFd_channel = 1/50 + 1/100 + 1/30
= 0.02 + 0.01 + 0.0333
= 0.0633
MTTFd_channel = 1/0.0633 ≈ 15.8 years
Therefore, the MTTFd level of this channel is Medium (10-30 years).
Calculation Using B10D Data
For electromechanical components with wear characteristics (such as relays, switches), B10D data is typically used to calculate MTTFd.
B10D Definition: Number of operations when 10% of components experience dangerous failure.
Calculation formula:
MTTFd = B10D / (0.1 × nop)
Where:
- B10D = Number of dangerous failures provided by manufacturer
- nop = Number of operations per year (operations/year)
Calculation Example:
A relay has the following parameters:
- B10D = 2,000,000 operations (dangerous failure)
- Annual operations nop = 100,000 operations/year
MTTFd = 2,000,000 / (0.1 × 100,000)
= 2,000,000 / 10,000
= 200 years → High level
1.6 BMS Application Example
Case: BMS Voltage Sampling Channel MTTFd Calculation
A single channel contains the following components:
| Component | Quantity | Individual MTTFd | 1/MTTFd Contribution |
|---|---|---|---|
| Voltage divider resistors | 2 | 1000 years | 0.001 × 2 |
| Filter capacitor | 1 | 100 years | 0.01 |
| ADC | 1 | 200 years | 0.005 |
| MCU processing | 1 | 100 years | 0.01 |
Calculation:
1/MTTFd_channel = 0.001 + 0.001 + 0.01 + 0.005 + 0.01
= 0.027
MTTFd_channel = 1/0.027 ≈ 37 years
Conclusion: The MTTFd level of this voltage sampling channel is High (≥30 years).
2. DC: Diagnostic Coverage
2.1 Definition and Basic Concepts
Diagnostic Coverage (DC) is a quantitative measure of the fault detection capability of safety-related parts.
Standard definition: A measure of diagnostic effectiveness, the ratio of detected dangerous failure rate to total dangerous failure rate.
Calculation Formula:
DC = λDD / λD
Where:
- λDD = Detected dangerous failure rate
- λD = Total dangerous failure rate
DC values are expressed as percentages, ranging from 0% (no diagnosis) to 100% (complete diagnosis).
When understanding DC, note the following:
-
Only Dangerous Failures Considered: DC only measures the detection capability for dangerous failures; safe failures do not affect the DC value.
-
Online Diagnosis: DC evaluates online diagnostic capability during system operation, excluding startup self-tests.
-
Weighted Average: Multi-module systems use DCavg (weighted average diagnostic coverage).
2.2 DC Classification
ISO 13849-1 divides DC into four levels:
| DC Range | Level Code | Description | Typical Characteristics |
|---|---|---|---|
| DC < 60% | None | No effective diagnosis | Basically no diagnostic measures |
| 60% ≤ DC < 90% | Low | Basic diagnosis | Basic monitoring measures |
| 90% ≤ DC < 99% | Medium | Comprehensive diagnosis | Multiple diagnostic measures |
| DC ≥ 99% | High | Complete diagnosis | Redundancy + cross-diagnosis |
2.3 DCavg Calculation Method
For safety-related systems containing multiple modules, the weighted average diagnostic coverage (DCavg) needs to be calculated.
Calculation Formula:
DCavg = (DC1/MTTFd1 + DC2/MTTFd2 + ... + DCn/MTTFdn)
/ (1/MTTFd1 + 1/MTTFd2 + ... + 1/MTTFdn)
This formula embodies an important concept: modules with lower MTTFd (higher failure rates) have a greater impact on DCavg.
Calculation Example:
A safety system contains three modules:
| Module | MTTFd | DC | DC/MTTFd |
|---|---|---|---|
| Input | 50 years | 90% | 0.018 |
| Logic | 100 years | 99% | 0.0099 |
| Output | 30 years | 60% | 0.02 |
Calculation:
DCavg = (0.018 + 0.0099 + 0.02) / (0.02 + 0.01 + 0.0333)
= 0.0479 / 0.0633
= 75.7% → Low level
Although the input and logic modules have higher DC, the output module’s low DC and low MTTFd reduce the overall DCavg.
2.4 Typical Diagnostic Measures and DC Values
Based on ISO 13849-1 Annex E, the following are typical diagnostic measures for each functional module and their corresponding DC values:
Input Module Diagnostics
| Diagnostic Measure | DC Value | Application Scenario | Implementation Points |
|---|---|---|---|
| No diagnosis | 0% | Basic input | Not recommended for safety functions |
| Range check | 60% | Analog sensors | Set upper and lower limits |
| Cross comparison | 90% | Dual sensors | Independent measurement |
| Full diverse redundancy | 99% | High safety requirements | Different technical principles |
| Periodic test pulse | 90% | Digital inputs | Regular testing |
| Timeout monitoring | 60% | Communication inputs | Watchdog mechanism |
Logic Module Diagnostics
| Diagnostic Measure | DC Value | Application Scenario | Implementation Points |
|---|---|---|---|
| No diagnosis | 0% | Simple logic | Hardwired logic |
| Watchdog | 60% | Program monitoring | Timeout reset |
| Program flow monitoring | 70% | Execution sequence | Flow checking |
| Memory checksum | 90% | RAM/Flash | Periodic verification |
| Dual-channel comparison | 99% | Redundant CPU | Cross verification |
| Clock monitoring | 60% | Clock checking | Frequency monitoring |
Output Module Diagnostics
| Diagnostic Measure | DC Value | Application Scenario | Implementation Points |
|---|---|---|---|
| No diagnosis | 0% | Basic output | Not recommended |
| Output state readback | 60% | Relay contacts | Feedback checking |
| Load current monitoring | 90% | Power output | Current detection |
| Force-guided contacts | 99% | Safety relay | Mechanical interlock |
| Dual output comparison | 90% | Redundant output | State comparison |
| Short circuit detection | 90% | Semiconductor output | Current/voltage monitoring |
2.5 BMS Application Example
Case: BMS Voltage Protection Channel DC Assessment
| Module | Diagnostic Measure | DC Assessment | Description |
|---|---|---|---|
| Voltage sampling | Dual ADC cross comparison | 90% | Redundant measurement |
| Digital filtering | Range check + rate of change | 60% | Signal reasonableness check |
| Threshold comparison | Independent comparator backup | 99% | Hardware comparator |
| Shutdown output | State readback + current monitoring | 90% | Double confirmation |
Assuming equal MTTFd for each module, simple average:
DCavg = (90% + 60% + 99% + 90%) / 4 = 84.75% → Low
Improvement Recommendation: Enhance the diagnostic capability of the digital filtering module, for example by adding signal trend analysis, which can increase DC from 60% to 90%, thereby bringing DCavg to Medium level.
3. CCF: Common Cause Failure Prevention
3.1 Definition and Basic Concepts
Common Cause Failure (CCF) is an issue that must be重点考虑 in redundant system design.
Standard definition: Failure caused by one or more events that causes two or more independent channels in a multi-channel subsystem to fail simultaneously.
CCF is important because it is the “Achilles’ heel” of redundant systems. Even if the system uses a multi-channel redundant architecture, if there exists a common cause that can cause all channels to fail simultaneously, the advantage of redundancy is completely lost.
Typical Scenarios:
- Power Failure: A single power supply powers two redundant channels; power failure causes both channels to fail simultaneously
- Environmental Factors: Overheating, vibration, contamination, and other environmental factors affect multiple channels simultaneously
- Software Defects: Identical software code running in two channels, same bug causes simultaneous failure
- Design Errors: Design specification errors affect all channels
- Maintenance Errors: Maintenance personnel perform incorrect maintenance on both channels simultaneously
3.2 Common Common Cause Failure Sources
| Category | Failure Source | Typical Example | Prevention Measures |
|---|---|---|---|
| Physical Factors | Temperature | Overheating causes two chips to fail simultaneously | Thermal design + temperature monitoring |
| Vibration | Vibration causes connectors to loosen simultaneously | Vibration damping + physical separation | |
| Contamination | Dust causes optocouplers to fail simultaneously | Sealing + clean environment | |
| Electrical Factors | Power | Power failure causes channels to fail simultaneously | Redundant power supply |
| EMC | Surge causes channels to be damaged simultaneously | EMI protection + isolation | |
| Ground loop | Common ground causes interference coupling | Electrical isolation | |
| Design Factors | Software | Same software bug affects multiple channels | Diverse design |
| Specification | Incorrect specification affects all channels | Independent verification | |
| Interface | Interface design defect affects multiple channels | Interface standardization | |
| Manufacturing Factors | Process | Batch defects affect all components | Incoming inspection + screening |
| Assembly | Assembly errors affect multiple channels | Process control | |
| Operational Factors | Maintenance | Incorrect maintenance affects multiple channels | Maintenance procedures |
| Operation | Misoperation affects multiple channels | Operator training |
3.3 CCF Quantification Method
ISO 13849-1 Annex F provides a CCF scoring table to quantify the effectiveness of common cause failure prevention measures. For Category 2, 3, and 4 architectures, the CCF score must reach or exceed 65 points.
Scoring Table Structure:
| Measure Category | Specific Measure | Score | Implementation Points |
|---|---|---|---|
| Separation/Isolation | |||
| Physical space separation | 15 | Different PCB areas/different boards | |
| Electrical isolation | 20 | Optocoupler/isolator/isolated power | |
| Diversity | |||
| Different technology | 20 | Different types of sensors/actuators | |
| Different design | 10 | Different design teams/methods | |
| Design/Application | |||
| Overvoltage protection | 15 | TVS/varistor/clamping | |
| Overcurrent protection | 10 | Fuse/resettable fuse | |
| EMC measures | 20 | Filtering/shielding/grounding | |
| Assessment/Analysis | |||
| FMEA analysis | 5 | Specific analysis for CCF | |
| Maintenance | |||
| Online diagnosis | 10 | Continuous or periodic diagnosis | |
| Training | |||
| Personnel training | 5 | Design/maintenance personnel training |
Scoring Principles:
- Total score must be ≥ 65 points
- Measures must be actually implemented, not just planned
- Scoring should be conservative; take lower score when in doubt
- Document scoring basis for audit
3.4 CCF Scoring Example
Case: BMS Dual-MCU System
A BMS uses a dual-MCU redundant architecture (Category 3) and requires assessment of CCF prevention measures.
| Measure | Implementation | Score | Basis |
|---|---|---|---|
| Physical separation | Two MCUs located in different PCB areas | 15 | PCB layout |
| Electrical isolation | ADC inputs use isolation amplifiers | 20 | Circuit schematic |
| Overvoltage protection | TVS + voltage regulator circuit | 15 | BOM + testing |
| Overcurrent protection | Resettable fuse | 10 | BOM + testing |
| EMC measures | Filtering + shielding + grounding design | 20 | EMC test report |
| Online diagnosis | Periodic self-test + cross monitoring | 10 | Software documentation |
| Personnel training | Design personnel training records | 5 | Training records |
| Total Score | 90 | ≥65 ✓ |
The system’s CCF score is 90 points, meeting the standard’s 65-point requirement.
4. Bar Chart Application Method
4.1 Bar Chart Overview
The bar chart (ISO 13849-1 Figure 12 / Annex K) is a graphical tool for simplified PL determination. By combining MTTFd level, DCavg level, and Category, you can directly look up the corresponding PL value.
Basic Principle:
- X-axis: MTTFd level
- Bars: PL values for different DCavg levels
- Y-axis: Corresponding PL level
4.2 Bar Chart Numerical Tables
Category B
| MTTFd | DC: None | PL |
|---|---|---|
| Low | - | a |
| Medium | - | b |
| High | - | b |
Note: Category B has no diagnostic capability, can only reach PL b at most.
Category 1
| MTTFd | DC: None | PL |
|---|---|---|
| Low | - | Not applicable |
| Medium | - | Not applicable |
| High | - | c |
Note: Category 1 requires MTTFd to be High, can reach PL c.
Category 2
| MTTFd | DC: None | DC: Low | DC: Medium | PL |
|---|---|---|---|---|
| Low | a | b | b | - |
| Medium | b | c | c | - |
| High | c | c | d | - |
Category 3
| MTTFd | DC: None | DC: Low | DC: Medium | DC: High | PL |
|---|---|---|---|---|---|
| Low | a | b | c | c | - |
| Medium | b | c | d | d | - |
| High | c | d | d | e | - |
Category 4
| MTTFd | DC: Low | DC: Medium | DC: High | PL |
|---|---|---|---|---|
| Low | c | d | e | - |
| Medium | d | d | e | - |
| High | d | e | e | - |
Note: Category 4 requires DC to be at least Low, can reach PL e at most.
4.3 Usage Steps
- Determine Category: Determine the category based on system architecture (B/1/2/3/4)
- Calculate MTTFd: Determine the MTTFd level of the channel
- Calculate DCavg: Determine the average diagnostic coverage level of the system
- Look up Table to Determine PL: Based on the above parameters, check the corresponding table
5. Comprehensive Calculation Examples
Case 1: BMS Overcurrent Protection Subsystem
System Description:
- Function: Detect battery pack current, cut off circuit when threshold is exceeded
- Target PLr: d
- Architecture: Category 2
Step 1: MTTFd Calculation
| Component | MTTFd | Source |
|---|---|---|
| Current sensor | 100 years | Manufacturer data |
| Sampling resistor | 500 years | Annex C |
| ADC | 200 years | Manufacturer data |
| MCU | 100 years | Safety manual |
| MOSFET driver | 100 years | Annex C |
| MOSFET | 50 years | Manufacturer data |
1/MTTFd_channel = 1/100 + 1/500 + 1/200 + 1/100 + 1/100 + 1/50
= 0.01 + 0.002 + 0.005 + 0.01 + 0.01 + 0.02
= 0.057
MTTFd_channel = 1/0.057 ≈ 17.5 years → Medium
Step 2: DCavg Calculation
| Module | Diagnostic Measure | DC |
|---|---|---|
| Current sensor | Range check + zero point calibration | 90% |
| ADC | Reference voltage comparison | 90% |
| MCU | Watchdog + program flow monitoring | 70% |
| MOSFET | Conduction state readback | 90% |
DCavg = (0.9/100 + 0.9/200 + 0.7/100 + 0.9/50) / (1/100 + 1/200 + 1/100 + 1/50)
= (0.009 + 0.0045 + 0.007 + 0.018) / (0.01 + 0.005 + 0.01 + 0.02)
= 0.0385 / 0.045
= 85.6% → Low
Step 3: CCF Scoring
| Measure | Score |
|---|---|
| Electrical isolation (isolated sampling) | 20 |
| Overvoltage protection | 15 |
| EMC measures | 20 |
| Periodic diagnosis | 10 |
| Total Score | 65 ≥ 65 ✓ |
Step 4: Determine PL
Check Category 2 table:
- MTTFd = Medium
- DCavg = Low
- PL = c
Conclusion: Achieved PL = c < Target PLr = d, Design does not meet requirements!
Improvement Solutions:
Solution 1: Improve DCavg
- Add dual ADC cross comparison → DC increases to 99%
- New DCavg ≈ 92% → Medium
- New PL = d ✓
Solution 2: Upgrade to Category 3
- Dual-channel redundant architecture
- Even with DCavg = Low, PL d can be achieved
Case 2: BMS Dual-MCU Overtemperature Protection (Category 3)
Target PLr: e
Parameters:
- MTTFd_channel1 = 30 years → High
- MTTFd_channel2 = 30 years → High
- DCavg = 95% → Medium
- CCF = 85 points ✓
Check Category 3 table:
- MTTFd = High
- DCavg = Medium
- PL = d
Conclusion: Achieved PL = d < Target PLr = e, improvement needed.
Improvement Solutions:
- Improve DCavg to High (≥99%)
- Or upgrade to Category 4 architecture
6. Frequently Asked Questions
Q1: Where is the most reliable source of MTTFd data?
A: In order of priority:
- Component manufacturer’s FMEDA reports or safety manuals
- Recognized industry databases (SN 29500, FMD-2016)
- Typical values from ISO 13849-1 Annex C
- Conservative estimates based on similar components
Q2: What if I cannot obtain MTTFd for a certain component?
A: Use a conservative estimation strategy:
- Refer to values of similar components
- Use values from Annex C
- If uncertain, use a lower MTTFd value (more conservative)
Q3: How to determine the MTTFd of each module when calculating DCavg?
A: The MTTFd of each module is the series calculation result of MTTFd of all components in that module. If the module is too complex for precise calculation, simplified estimates can be used, but conservative principles should be maintained.
Q4: Must the CCF score reach 65 points?
A: Yes, for Category 2, 3, and 4, the CCF score must reach or exceed 65 points. This is a mandatory requirement of the standard, not an option. Scoring should be based on actually implemented measures, not just design intent.
Q5: What is the difference between bar chart and precise calculation?
A:
- Bar chart: Simplified method, gives conservative PL level, suitable for most engineering applications
- Precise calculation: Uses Markov models and other methods to calculate PFH, suitable for complex systems or scenarios requiring precise analysis
The bar chart is conservative; if the bar chart result meets requirements, precise calculation is usually not necessary.
Q6: What level can BMS systems typically achieve for MTTFd?
A: Typical BMS subsystems:
- Single-channel voltage sampling: MTTFd approximately 30-50 years (High)
- MCU processing logic: MTTFd approximately 50-100 years (High)
- Power switches: MTTFd approximately 20-50 years (Medium-High)
Specific values depend on component selection, derating design, and application environment.
7. Summary
The three key parameters of ISO 13849-1 provide quantitative assessment methods for the design of safety-related control systems:
- MTTFd: Ensures components are sufficiently reliable from a reliability perspective
- DC: Ensures faults can be detected in a timely manner from a diagnostic perspective
- CCF: Ensures redundant channels are truly independent from an independence perspective
These three parameters work together, combined with system architecture categories, to ultimately determine the Performance Level (PL) that the system can achieve. In practical engineering, you should:
- Prioritize selection of high-reliability components (high MTTFd)
- Design comprehensive diagnostic mechanisms (high DC)
- Implement effective common cause failure prevention (high CCF score)
- Select appropriate architecture category based on target PL
Through systematic parameter calculation and architecture design, safety-related control parts can be ensured to meet expected safety integrity requirements.
References
Standard Clauses
| Content | Standard Clause |
|---|---|
| MTTFd definition | ISO 13849-1:2023 3.1.32 |
| MTTFd calculation | ISO 13849-1:2023 6.1.4 |
| MTTFd typical values | ISO 13849-1:2023 Annex C |
| DC definition | ISO 13849-1:2023 3.1.35 |
| DC estimation | ISO 13849-1:2023 Annex E |
| CCF definition | ISO 13849-1:2023 3.1.13 |
| CCF quantification | ISO 13849-1:2023 Annex F |
| Bar chart | ISO 13849-1:2023 Annex K |
Recommended Reading
- ISO 13849-1:2023 “Safety of machinery - Safety-related parts of control systems - Part 1: General principles for design”
- IFA Report 2/2017e “Design of safety-related control systems based on ISO 13849-1”
- SN 29500 Siemens Component Reliability Database
- IEC 62380 Electronic Equipment Reliability Data Handbook